How to analyse SEM image using ImageJ

[ismav123]

Hi all,
    I have a SEM image for analysis. I have to be able to count the number
of layers in a multilayer(2 materials) polymeric film containing more than
100 layers and also calculate the thickness of each layer(seperately). I am
new to using this software, so still cant figure out how to automate it(the
counting or thickness measurements).

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Regards
Vamsi

[ismav123]

Attached here is a sample image for the same Could anyone please let me know how i can analyse the number of layer and also be able to mark the layers individually based on their thickness

[GCH-2]

Vamsi

It will not be difficult to implement a routine for measuring the  
thickness of these layers, provided you have a good contrast between  
the layers and the background. I see that the image is acquired in  
secondary electron mode. What kind of material are you analyzing?  
Have you tried with backscatter electron mode? Why do you need low  
vacuum?

Regards,

Gary.
http://www.gcsca.net



On Nov 30, 2010, at 7:14 PM, ismav123 wrote:

> Attached here is a sample image for the same Could anyone please  
> let me know
> how i can analyse the number of layer and also be able to mark the  
> layers
> individually based on their thickness
> http://imagej.588099.n2.nabble.com/file/n5789112/sample6_002.png
> --
> View this message in context: http://imagej.588099.n2.nabble.com/ 
> How-to-analyse-SEM-image-using-ImageJ-tp5766409p5789112.html
> Sent from the ImageJ mailing list archive at Nabble.com.

[ismav123]

Hi gary,
   This was just a sample image from the research we are doing. I am analysing multilayer films of two amorphous polymers made by coextrusion method. I have tried backscatter electron mode but it just produces a black image on switching beam on. Likewise I need low vaccum mode for my polymers which were stained.
Regards
Vamsi

On Tue, Nov 30, 2010 at 7:55 PM, GCH-2 [via ImageJ] <[hidden email]> wrote:

Vamsi

It will not be difficult to implement a routine for measuring the  
thickness of these layers, provided you have a good contrast between  
the layers and the background. I see that the image is acquired in  
secondary electron mode. What kind of material are you analyzing?  
Have you tried with backscatter electron mode? Why do you need low  
vacuum?

Regards,

Gary.
http://www.gcsca.net



On Nov 30, 2010, at 7:14 PM, ismav123 wrote:

> Attached here is a sample image for the same Could anyone please  
> let me know
> how i can analyse the number of layer and also be able to mark the  
> layers
> individually based on their thickness
> http://imagej.588099.n2.nabble.com/file/n5789112/sample6_002.png
> --
> View this message in context: http://imagej.588099.n2.nabble.com/ 
> How-to-analyse-SEM-image-using-ImageJ-tp5766409p5789112.html
> Sent from the ImageJ mailing list archive at Nabble.com.

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Regards

Vamsi