Hi,
NeLaS, NeLaS said. I've been testing the Extended Depth of Field, Stack Focuser and Z Projections and the results are getting better each time I try something different! It seems that what you need to do really depends on the original photos properties... so each set is a new challenge... Next time I'll take better photos :-)! Noel replies True so true. I have one question about file format and one about taking photos for focusing and 3D reconstruction. 1- I wanted to compare the results of focusing a JPG stack and a TIFF stack= , but I don't have any TIFF stack right now. Could the noise and abnormalitie= s present in my focused picture be a consequence of the jpg compression? Noel says, Absolutely, do not use JPG for this. I know this sounds a bit obvious but maybe a high quality JPG does not differ too much (or at least not visually) when compared to a focused TIFF stack. Just use Tiff or some other uncompressed unaltered data. 2- The minimum number of photos for a building a focused stack should be th= e Z axis object size / Depth of field. This assures that every part of the study object has an "in focus" section. Is that correct? Noel says Seems to be true. However, what is the value for DOF (depth of field) (or is that depth of focus). Consideration of how you can tell an image is in focus or not comes down to two necessary conditions, which mean similar things from a different point of view. Firstly from the energy point of view, the energy at focus is maximum. For Luminous parts of the image, this means the in focus bright points are brightest. For dark parts of the image the intensity is minimum. Out of focus is featureless grey. Secondly, from the fine detail point of view, when the change from pixel to pixel is a maximum, you are at focus. That is the differential signal is maximised. The stack focusser works by looking at the changes between pixels. And the wavelet focusser probably does a similar thing. The question you are asking is: what change in the focus causes some perceptible/measureable change in the image. My experience is that the zone in focus slowly moves across a sloping surface, and it has a finite width. The difficult thing is estimating just where its edges lie. The space between really sharp and really blurred is finite. We look at metallic fractures and other opaque objects and it is my experience that a finely etched surface, with lots of fine detail and texture works really well with the sharpness based evaluations. My calculations of the DOF based upon the 1/4 wavelength criterion (Rayleigh Limit) indicate a number somewhat smaller than that which is perceptible. If a 1/2 wavelength is chosen then this is more similar to what is seen. However, in the interests of taking a few extra samples, ie oversampling then there is no reason, apart from time constraints etc, to making the slice depth any suitable arbitrary size. Of course, if you obtain noise in your images and have no strategy to cope with that you may end up with all of the noise in the result. Now my question is: to get better results during Focusing stacks should I take the minimum number of pictures or should I take more and overlap the "in focus" areas of the object study??? don't know if I was clear enough...= ! Noel says. Take at least as many as the minimum, otherwise you get fuzzy areas, and maybe add some more in a controlled way to see if it makes any difference. The advantage of this is that you may be able to choose a good number for the slice depth, and the smooth sliding of the in focus zone down a slope may well define things more finely. Hope this helps. Noel |
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