SIFT-based registration parameters explained

Posted by Albert Cardona on Mar 20, 2008; 1:46pm
URL: http://imagej.273.s1.nabble.com/SIFT-based-registration-parameters-explained-tp3696810.html

Hi all,

For those of you using TrakEM2's based image registration, we have put
up some explanations on how to fine-tune the parameters.

http://www.ini.uzh.ch/~acardona/howto.html#sift_parameters


There are also examples on feature extraction using SIFT, and
particularly about the effect of the maximum image size parameter on the
number (and size) of the features extracted:

http://www.ini.uzh.ch/~acardona/howto.html#feature_extraction

Hope that helps.

Albert

--
Albert Cardona
http://www.mcdb.ucla.edu/Research/Hartenstein/acardona