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Hi all,
I am trying to calculate the uncertainty associated to particles analisys and in particular feret data.
I start with SEM micrograph of particles deposited on filter membrane. Micrographs are taken at 25000x.
At this magnification 1 pixel is equal to 14.7 nm.
Selecting the threshold value can be a great source of errors in measurement data, and increase with smaller particles.
Without a granulometric standard it is difficyult to estimate some kind of uncertainty on these data.
I was wondering about how to have the highest accurate threshold possible.
One option I am consdering could be to take a point-to-point manual measurement with teh scaler tool of teh microscope, on a particle observed at higher mag than 25000, for ex. 250000x (at this mag 1 px is equal to 1.47nm) and then re-process the same particle taken this time at working mag (25000x)with IJ and compare measurement.
do you think could be a possible method to estimate uncertainty? has ever anyone been involved in calculation like this ?
thanks in advance..
Lxq
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